MESOSCOPE provide Direct Short defect solution by Nano Probing
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- 2021-10-12
To locate Direct Short defect by Nano Probing
In the traditional failure analysis method, direct short has always been one of challenge task to user。Due to the low resistance, EBIRCH can't present obvious signal ; And EBAC will light up all the conducting path.
MESOSCOPE uses the most advanced E-Beam amplifier to accurately locate short defect which below 200 ohm
Interpret low ohmic signal position through Nano Probing and E-Beam located method
Rotate the angle and Zoom in to confirm the authenticity of the signal
