MSCT-SA025TPL013TC025-CR2
CR2 is ideal for failure analysis ≦2nm process.
MESOSCOPE designs and fabricates Metallic Nano-scale probe tip. Via Core-technology, Micro-Surface-Treatment process, all products are cleaned and contact resistance could be down to 50ohm.
CR2 is ideal for failure analysis ≦2nm process.
CR1 is ideal for failure analysis ≦2nm process.
CR5 is ideal for failure analysis 5nm-10nm process.
CR3 is ideal for failure analysis ≦5nm process.
CR7 is ideal for failure analysis 10nm-20nm process.
CR7 is ideal for failure analysis 7nm-10nm technology process.
CR50 is ideal for failure analysis ≧55nm process.
Available to be measured below 250nm device
CR200 is ideal for failure analysis ≧180nm process.
Available to be measured below 150nm device
Available to be measured below 130nm device
CR10 is ideal for failure analysis 10nm to 20nm technology process.
Standard type has better durability.