MSCT-SA025TPL013TC025A1-CR35
CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.
Curvature Radius 35nm probe.
CR35 is ideal model for failure analysis 20nm to 32nm technology.
CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.
CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.
CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.