MSCT-SA025TPL013TC025A1-CR35B

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CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.

Available on FEI, JEOL, Tescan, Zeiss and Kleindiek systems.
No need to proceed Chemical Clean Process.
Have SEM inspection before packing.
Tip Resistance is under 50ohm.
Have MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
Wire diameter option: 0.1mm,0.25mm, 0.3mm, 0.5mm and 0.6mm
Available to be measured 10nm to 20nm device

Material	Tungsten	Coating Material	NA
Wire Diameter ( WD)	0.25mm	Total Probe Length(TPL)	13mm
Tape Cone ( TC)	2.5mm	Tip Body Diameter(TBD)	-
Tape Cone Angle Type	A1	Curvature Radius(CR)	<35nm
Probe Pre-bent	Yes	Pre-sleeved into Capillary	-
Suitable for measuring Process	20nm to 45nm Manufacturing Process

MSCT	-	SA	025	TPL013	TC025	A1	-	CR35	B
		(1)	(2)	(3)	(4)	(5)		(6)	(7)

Probe application type: SA is for SEM based electrical nano-probing application.
Probe wire diameter (WD): 0.25mm
Total probe length (TPL): 13mm
Tape Cone length (TC): 2.5mm.
Cone Angle type: A1
Available option: A1, A2
Tip curvature radius (CR): <35nm.
Diameter at position of 50nm below apex is in the range of 65nm to 80nm.
Probe pre-bent type
Default pre-bent angle is 45degrees

MESOSCOPE is the world leader in Nano-scale metallic probe manufacturer.

2F.-2, No.9, Zhanye 1st Rd., East Dist., Hsinchu City 30078, Taiwan

886-3-6661059

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