Product
MSCT-SA025TPL013TC025-CR250
Available to be measured below 250nm device
- Available on FEI, Joel, Tescan, Zeiss and Kleindiek systems.
- No need to proceed Chemical Clean Process.
- Have SEM inspection before packing.
- Tip Resistance is under 50ohm.
- Have MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
- Wire diameter option: 0.1mm,0.25mm, 0.3mm, 0.5mm and 0.6mm
- Available to be measured below 250nm device
Material | Tungsten | Coating Material | NA |
Wire Diameter ( WD) | 0.25mm | Total Probe Length(TPL) | 13mm |
Tape Cone ( TC) | 2.5mm | Tip Body Diameter(TBD) | - |
Tape Cone Angle Type | - | Curvature Radius(CR) | <250nm |
Bended Tip | - | Sleeved into Capillary | - |
Suitable for measuring Process | ≤250nm Manufacturing Process |
MSCT | - | SA | 025 | TPL013 | TC025 | - | CR250 |
---|---|---|---|---|---|---|---|
(1) | (2) | (3) | (4) | (5) |
- Probe application type: SA is for SEM based electrical nano-probing application.
- Probe wire diameter (WD): 0.25mm
- Total probe length (TPL): 13mm
- Tape Cone length (TC): 2.5mm.
- Tip curvature radius (CR): <250nm.